On July 24, a delegation of European youth leaders from over 10 European countries visited Jiangmen. They participated in a sub-event of the "Bridge to the Future: European Youth Leaders' Tour of the Greater Bay Area," immersing themselves in the charm of this renowned hometown of overseas Chinese.
Members of the delegation visited the Kaiping Diaolou Cluster, the Kaiping Cultural Tourism Entrepreneurship Incubation Base, the Xianfeng Tianxia Granary Bookstore, and the China Qiaodu Museum of Overseas Chinese.
During their visit, many delegates expressed astonishment at the Diaolou's fusion of Chinese and Western architectural aesthetics and its embodiment of overseas Chinese heritage. They were also interested in Jiangmen's cultural creativity, rural revitalization efforts, and its model for supporting youth entrepreneurship.
European youth leaders explore Diaolou Cluster in Kaiping.
Many delegates are interested in Jiangmen's cultural creativity.
This year marks the 50th anniversary of diplomatic relations between China and the European Union (EU). Nearly 130,000 Jiangmen-born overseas Chinese reside in Europe and have made significant contributions to bilateral relations. The Sino-Europe (Jiangmen) SME International Cooperation Zone is the only platform in China that facilitates cooperation between Chinese and foreign small and medium-sized enterprises across Europe.
In recent years, the Sino-Europe (Jiangmen) SME International Cooperation Zone has attracted a significant number of European-funded projects. By the end of last year, this cooperation zone had registered over 160 European-funded enterprises, with cumulative investments exceeding 15 billion US dollars.
The head of the delegation, Jacobo García, described this visit as a "unique opportunity to understand China." Liang Hongwu, a member of the Standing Committee of the CPC Jiangmen Municipal Committee, hopes to deepen cooperation with Europe and promote mutual understanding between the peoples.
Reporter: Zhang Jingyuan, He Xiaotong
Photo: Yang Xingle
Editor: Wei Shen, James, Shen He